Li X., Feenstra R., Civale L., Holesinger T., Larbalestier D., Huang Y., Rupich M, Coulter Y., Feldmann M.
Rupich M.W., Li X., Zhang W., Kodenkandath T., Holesinger T.G., Larbalestier D.C., Kim S.I., Gurevich A., Song X.
Ключевые слова: HTS, YBCO, coated conductors, MOD process, ex-situ process, thickness dependence, critical current, critical current density, irreversibility fields, pinning force, substrate Ni-W, RABITS process, Jc/B curves, experimental results, critical caracteristics, fabrication, magnetic properties
Thieme C.L., Li X., Kodenkandath T., Goyal A., Heatherly L., Sathyamurthy S., Martin P.M., Rupich M.W.(mrupich@amsuper.com), Paranthaman M.P.(paranthamanm@ornl.gov)
Ключевые слова: HTS, YBCO, coated conductors, MOD process, buffer layers, chemical solution deposition, substrate Ni-W, fabrication
Li X., Nishijima G., Awaji S., Watanabe K., Zhang X., Ma Y.(ywma@mail.iee.ac.cn), Xu A.
Ключевые слова: MgB2, bulk, fabrication, magnetic field dependence, Jc/B curves, experimental results, critical caracteristics
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, fabrication, microstructure
Ключевые слова: HTS, transformers, Bi2223, tapes, winding configurations, numerical analysis, power equipment
Rupich M.W., Schoop U., Thieme C., Li X., Zhang W., Kodenkandath T., Nguyen N., Siegal E., Goyal A., Paranthaman M., Verebelyi D.T., Civale L., Maiorov B., Holesinger T.
Rupich M.W., Thieme C.L., Schoop U., Li X., Zhang W., Kodenkandath T., Goyal A., Verebelyi D.T., Paranthaman M.P., Sathyamurthy S., Bhuiyan M.S.
Rupich M.W., Li X., Kodenkandath T., Rane M.V.(mrane@uamail.albany.edu), Efstathiadis H., Bakhru H.((hb694@albany.edu), Zhang W.(wzhang@amsuper.com), Haldar P.
Ключевые слова: HTS, YBCO, TFA-MOD process, microstructure, buffer layers, interfaces, fabrication
Li X., Zhang W., Kodenkandath T., Rupich M., Huang Y., Long N., Strickland N., Chapman B., Ross N., Xia J.
Ключевые слова: HTS, YBCO, coated conductors, nanodoping, pinning centers, Jc/B curves, angular dependence, defects, experimental results, critical caracteristics
Sun J., Zhang Y., Li X.(yylixs@yahoo.com.cn), Chen Q.(chenqiao@mail.hust.edu.cn), Long G.(loangguzong@sina.com)
Ключевые слова: HTS, Bi2223, tapes, transformers single phase, design parameters, numerical analysis, power equipment
Schoop U., Li X., Kodenkandath T., Rupich M., Goyal A., Paranthaman M., Sathyamurthy S., Lee D.F., Bhuiyan M.S.(bhuiyanms@ornl.gov), Payzant E.A.(payzanta@ornl.gov)
Ключевые слова: HTS, YBCO, coated conductors, RABITS process, buffer layers, solution techniques, fabrication
Rupich M.W., Thieme C., Li X., Kodenkandath T., Goyal A., Paranthaman M., Aytug T., Christen D.K., Budai J.D., Cantoni C., Gapud A.A., Schoop U.(uschoop@amsuper.com), Kim K.(kyz@ornl.gov)
Miller D.J., Maroni V.A., Rupich M.W., Li X., Zhang W., Kodenkandath T., Gray K.E., Reeves J., Vlasko-Vlasov V.K., Claus H., Trasobares S., Lei Y., Hiller J.M., Venkataraman K.(venkataraman@wisc.edu)
Ключевые слова: MgB2, wires, PIT process, Jc/B curves, experimental results, critical caracteristics, fabrication
Rupich M.W., Li X., Zhang W., Arendt P.N., Foltyn S.R., Jia Q.X., Wang H., MacManus-Driscoll J.L., Holesinger T.G., Coulter J.Y., Maiorov B., Serquis A., Willis J.O., Civale L.(lcivale@lanl.gov)
Venkataraman K., Schoop U., Thieme C., Li X., Zhang W., Kodenkandath T., Nguyen N., Siegal E., Lynch J., Scudiere J., Verebelyi D.T., Holesinger T.G., Rupich M.W.(mrupich@amsuper.com), Teplitsky M., Maroni V., Miller D.
Ключевые слова: HTS, coated conductors, RABITS process, MOD process, YBCO, substrate Ni-W, fabrication, microstructure, critical current density, review, critical caracteristics
Chen C., Xu J., Zhou Z.-J., Li X.-Q., Wang Y.-H., Gao Z.-X., Feng Q.-R.(qrfeng@pku.edu.cn)
Ключевые слова: MgB2, phase formation, precursors, nanoparticles, heat treatment, microstructure, resistance, fabrication
Verebelyi D.T.(dverebelyi@amsuper.com), Schoop U., Thieme C., Li X., Zhang W., Kodenkandath T., Malozemoff A.P., Nguyen N., Siegal E., Buczek D., Lynch J., Scudiere J., Rupich M., Goyal A., Specht E.D., Martin P., Paranthaman M.
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